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X-Ray Scattering $180.00
Editors: Christopher M. Bauwens
Book Description:
X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. In this book, the authors present current research in the study of X-ray scattering, including real-time synchrotron X-ray scattering, applications of X-ray scattering in edible lipid systems; X-ray scattering of bacterial cell wall compounds and their neutralization and small angle X-ray scattering analysis of nanomaterials for ultra large scale integrated circuits. (Imprint: Nova)

Table of Contents:

GISAXS - Probe of Buried Interfaces in Multilayered Thin Films pp.1-54
(P. Siffalovic, M. Jergel, E. Majkova, Institute of Physics, Slovak Academy of Sciences, Bratislava, Slovakia)

In situ, Real-Time Synchrotron X-ray Scattering pp.55-86
(Bridget Ingham, Industrial Research Ltd., Lower Hutt, New Zealand)

Applications of X-ray Scattering in Edible Lipid Systems pp.87-106
(Cristián Huck-Iriart, Noé Javier Morales-Mendoza, Roberto Jorge Candal, María Lidia Herrera, Instituto de Química Inorgánica, Medio Ambiente y Energía (INQUIMAE), Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Ciudad Universitaria, Buenos Aires, Argentina, and others)

Small angle X-ray Scattering Analysis of Nanomaterials for Ultra Large Scale Integrated Circuits pp.107-132
(T.K.S. Wong, T.K. Goh, Division of Microelectronics, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, and others)

X-ray Scattering of Bacterial Cell Wall Compounds and their Neutralization pp.133-148
(Michael Rappolt, Manfred Rössle, Yani Kaconis, Jörg Howe, Jörg Andrä, Thomas Gutsmann, Klaus Brandenburg, Institute of Biophysics and Nanosystems Research, Austrian Academy of Sciences, Basovizza, Italy, and others)

Decomposition of WAXS Diffractograms of Semicrystalline Polymers by Simulated Annealing pp.149-178
(Gopinath Subramanian, Rahmi Ozisik, Rensselaer Polytechnic Institute, Troy, New York, USA)

Depth Profile Analysis of Surface Layer Structure using X-ray Diffraction and X-ray Refectivity at Small Glancing Angles of Incidence ^ pp.179-220
(Yoshikazu Fujii, Kobe University, Kobe, Japan)

SAXS/WAXS Characterization of Sol-Gel Derived Nanomaterials ^ pp.221-238
(Gang Chen, Ohio University, Athens, Ohio, USA)


      Materials Science and Technologies
   Binding: ebook
   Pub. Date: 2011
   Pages: 7 x 10 (NBC - R)
   ISBN: 978-1-62417-506-0
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