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Focus on Applied Statistics
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Editors: Ahsanullah, Mohammad (Rider University)
Book Description:
Computers have taken a permanent place in almost every human endeavor in the last 20 years. This infiltration requires a learning process on the part of the people utilizing them and realizing where and how they can be best used beyond the basic and obvious applications. Statistics is an example of their application in many diverse fields to reach conclusions and make projections never before possible. Beyond this, applied statistics is rapidly becoming not only an instrument, but an integral part of the advance of knowledge. There are many fields such as medicine, biology, weather prediction, military planning, and many others where the statistical studies are essential before the next step can be taken. This book gathers together the latest research in this dynamic and link field.

Table of Contents:
Preface; A Family of Estimators for the Coefficient of Determination in Linear Regression Models (Anil K. Srivastava and Shobhit); Regression Versions of Lukacs Type Characterizations for the Bivariate Gamma Distribution (Konstancja Bobecka); Testing the Hypothesis that a Point Process Has a Markov-Dependent Interval Sequence (Franz Streit); Simultaneous Prediction in Restricted Regression Models (M Dube and Veena Manocha); Generalized Negative Binomial Regression Model (Felix Famoye and Edwin H. Kaufman, Jr.); OLS Bias and MSE in the Random Walk Model with a Constant Initial Value (Albert K. Tsui and Mukhtar M. Ali); On the Quasi-Random Sequences in the Random Processes Modeling Algorithms (Sergei Ermakov and Tatiana Tovstik); Locating a Change Point in a Gaussian Model when an Outlier is Present (Jie Chen and N. Balakrishnan); Estimation of the Smaller and Larger of Two Exponential Scale Parameters (Alvard Y. Arazyan, Nabendu Pal and Wei-Hsuing Shen); Pitman Nearness Comparison of Estimators of Parameters of Exponential Distribution in the Truncated Space (N. Sanjari Farsipour); Classical And Bayesian Reliability Estimation of the Negative Binomial Distribution (Ajit Chaturvedi and Sanjeev K. Tomer); A Bayesian Analysis for Correlated Binary Data in the Presence of Covariates (Jorge Alberto Achcar and Vanderly Janeiro); The Generalized Multivariate Modified Bessel Distribution and its Bayesian Applications (L. Thabane and M. Safiul Haq); A Bayesian Design for the Optimal Allocation of Binomial Samples (Athanassios Katsis and Blaza Toman); Shrinkage Estimation of the Exponential Reliability with Censored Data (Ayman Baklizi); Optimal Equivariant Vector Prediction in Location Families (Martin L. William and T. M. Durairajan); Index.

   Binding: Hardcover
   Pub. Date: 2003
   ISBN: 1-59033-911-8
  
  
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